作 者:Y. Jeevan Nagendra Kumar ;T. V. Rajini Kanth
出 处:International Journal of Electrical and Computer Engineering. 2017 ;7(1):460-468.doi:10.11591/ijece.v7i1.pp460-468
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174941