作 者:R. R. Adiputra ;S. Hadiyoso ;Y. Sun Hariyani
出 处:International Journal of Electrical and Computer Engineering. 2018 ;8(2):939-945.doi:10.11591/ijece.v8i2.pp939-945
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174427