作 者:Thi Thu Nguyen ;Phuc Thinh Doan ;Anh-Ngoc Le 等
出 处:International Journal of Electrical and Computer Engineering. 2022 ;12(1):785-792.doi:10.11591/ijece.v12i1.pp785-792
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038386162