作 者:Van Loi Nguyen ;Donglim Kim ;Phi Van Ho 等
出 处:International Journal of Electrical and Computer Engineering. 2017 ;7(3):1246-1254.doi:10.11591/ijece.v7i3.pp1246-1254
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174776