作 者:Huu Ai Duong ;Van Loi Nguyen ;Khanh Ty Luong
出 处:International Journal of Electrical and Computer Engineering. 2022 ;12(1):966-973.doi:10.11591/ijece.v12i1.pp966-973
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038386185