作 者:Hoan Bao Lai ;Anh-Tuan Tran ;Van Huynh 等
出 处:International Journal of Electrical and Computer Engineering. 2022 ;12(1):157-165.doi:10.11591/ijece.v12i1.pp157-165
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038386167