作 者:Christopher S. Baidal ;Nestor X. Arreaga ;Vladimir Sanchez Padilla
出 处:International Journal of Electrical and Computer Engineering. 2020 ;10(6):5853-5860.doi:10.11591/ijece.v10i6.pp5853-5860
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:259948881