作 者:Ha Huy Cuong Nguyen ;Bui Thanh Khiet ;Van Loi Nguyen 等
出 处:International Journal of Electrical and Computer Engineering. 2022 ;12(2):1571-1578.doi:10.11591/ijece.v12i2.pp1571-1578
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038386211