作 者:B. Danouj ;S. A. Tahan ;E. David 等
出 处:International Journal of Electrical and Computer Engineering. 2021 ;11(3):1942.doi:10.11591/ijece.v11i3.pp1942-1950
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:259949130