文章基本信息

标题：Bayes Reliability Measures of Lognormal and Inverse Gaussian Distributions under ML-II e-contaminated Class of Prior Distributions
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作者：Pankaj Sinha ; J. Prabha
期刊名称：Defence Science Journal
印刷版ISSN：0976-464X
出版年度：2010
卷号：60
期号：4
页码：442-450
DOI：10.14429/dsj.60.486
语种：English
出版社：Defence Scientific Information & Documentation Centre
摘要：ML-II e-contaminated class of priors are employed to study the sensitivity of Bayes reliability measures for a lognormal (LN) distribution and inverse Gaussian (IG) distribution to mis-specification in the prior is employed. The numerical illustrations suggest that reliability measures of both the distributions are not sensitive to moderate amount of mis-specification in prior distributions belonging to the class of ML-II e-contaminated. Defence Science Journal, 2010, 60(4), pp.442-450 , DOI:http://dx.doi.org/10.14429/dsj.60.486
关键词：Bayes reliability, lognormal distribution, inverse Gaussian distribution, Bayesian methodology