文章基本信息

标题：An Entropy based Method for Defect Prediction in Software Product Lines
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作者：ChangKyun Jeon ; Chulhoon Byun ; NeungHoe Kim 等
期刊名称：International Journal of Multimedia and Ubiquitous Engineering
印刷版ISSN：1975-0080
出版年度：2014
卷号：9
期号：3
页码：375-378
出版社：SERSC
摘要：Determining when software testing should begin and the number of resources that may be required in order to find and fix defects are complicated decisions. If we can predict the number of defects for an upcoming software product given the current development team, it will enable us to make better decisions. A majority of reported defects are managed and tracked using a defect life cycle, which tracks a defect throughout its lifetime. The process starts when the defect is found and ends when the resolution is verified and the defect is closed. Defects transition through different states according to the evolution of the project, which involves testing, debugging, verification. In paper, we presents defect prediction model for consecutive software products that is based on entropy
关键词：Defect prediction; defect life cycle; Entropy; product line engineering; software ;engineering