文章基本信息

标题：A revisit to the relationship between patents and R&D using empirical likelihood estimation
本地全文：下载
作者：Sheng-Pin Hsueh ; Wei-Ming Lee
期刊名称：Economics Bulletin
电子版ISSN：1545-2921
出版年度：2012
卷号：32
期号：2
页码：1208-1214
出版社：Economics Bulletin
摘要：In this paper we reexamine the relationship between patents and R&D using empirical likelihood estimation. Based on the data of Hall, Griliches, and Hausman (1986) and the specification allowing for endogenous regressors, we found that the contemporaneous effect of R&D is significantly positive, yet the first-lag effect is significantly negative. Moreover, the total effect of R&D is much larger than those found in the early studies.
关键词：patent; R&D; panel count data; empirical likelihood