文章基本信息

标题：RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION
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作者：G. Srinivasa Rao ; R.R.L. Kantam ; K.Rosaiah 等
期刊名称：Journal of Reliability and Statistical Studies
印刷版ISSN：0974-8024
电子版ISSN：2229-5666
出版年度：2012
卷号：5
期号：1
页码：55-64
出版社：Ankur Printing Palace
摘要：In this paper we consider a generalization of the log-logistic distribution called Type-IIexponentiated log-logistic distribution suggested by Kotz and Nadarajah (2000). The operatingcharacteristic for a sampling plan is determined for the case that a lot of products are submittedfor inspection with lifetimes specified by a Type-II exponentiated log-logistic distribution(TELLD). The resultsare illustrated by a numerical example
关键词：Type;-;II Exponentiated Log;-;logistic Distribution; Reliability Test Plans