文章基本信息

标题：Joint effect of Learning and Testing Effort in SRGM with Fault Dependent Correction Delay
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作者：Shaik Mohammad Rafi ; Dr.K Nageswara Rao ; Dr. S . Pallam Setty 等
期刊名称：International Journal of Computer Science and Information Technologies
电子版ISSN：0975-9646
出版年度：2012
卷号：3
期号：5
页码：4961-4967
出版社：TechScience Publications
摘要：Software Reliability growth models are helping the software society in predicting and analyzing the software product in terms of quality. In this context several software reliability growth models are proposed in the literature. Majority of models concentrated on fault detection process, ignoring the correction. Error detection, correction and dependency are the important phenomenon for the software reliability models. In this paper we proposed a new SRGM model based on correction lag and error dependency in SRGM with incorporating the testing effort and learning. All numerical calculations are carried out on real datasets and results are analyzed. By analyzing the results we can say that our proposed model fits well for the datasets.
关键词：Non homogeneous possoin process; software;reliability growth model; correction lag; testing effort.