文章基本信息

标题：Sram Cell Static Faults Detection and Repair Using Memory Bist
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作者：Shaik Moulali ; Dr. Fazal Noor Bhasha ; B.Srinivas 等
期刊名称：International Journal of Computer Science and Information Technologies
电子版ISSN：0975-9646
出版年度：2012
卷号：3
期号：1
页码：3264-3268
出版社：TechScience Publications
摘要：Memories are one of the most universal cores. On average embedded RAMs occupy 90% area in system-on-chip (SOC), so embedded memory test design has become an essential part of the SOC development infrastructure. Here we designed reusable memory built in self test (MBIST) engine for memory test, which also gives useful information for fault diagnosis. A simple architecture for built in self repair is implemented. Integrating BISR in MBIST improves the chip yield. SOC consists of many memory models. Like, SRAM, FLASH, ROM etc, we consider here only SRAM type of memory core.Here we will see what the functional model of SRAM is and what types of Functional Faults, Fault Models and Defects exist in SRAM cores due to process variation and manufacturing. xilinx spartan3E tool used for synthesise and simulation.
关键词：Mbist; Bist; Bisr; Redundancy Logic.tion