文章基本信息

标题：Test Case Generation for Concurrent System using UML Combinational Diagram
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作者：Monalisha Khandai ; Arup Abhinna Acharya ; Durga Prasad Mohapatra 等
期刊名称：International Journal of Computer Science and Information Technologies
电子版ISSN：0975-9646
出版年度：2011
卷号：2
期号：3
页码：1172-1181
出版社：TechScience Publications
摘要：The unreasonable interference of concurrent threads makes the testing activity for concurrent systems a difficult task. Test case explosion is the major problem in concurrency testing and make an interruption in systematic testing of concurrent systems. In this paper we propose an approach of generating test cases from combinational UML models. In our approach Activity Diagram (AD) and Sequence Diagram (SD) are used to model a system. The AD has converted into a graph called Activity Graph (AG) and SD into a graph called Sequence Graph (SG). Finally AG and SG are combined to form a graph called Activity Sequence Graph (ASG). The ASG is traversed using a traversing algorithm to generate the test cases. After comparing the test cases generated from ASG with the test cases generated from AG and SG, it is found that the test cases generated from ASG gives a better coverage when compared with the test cases from single modelling graph. The test cases are generated by controlling the test case explosion and are useful for controlling synchronization fault, loop fault, as well as scenario faults and interaction faults.TCHA d
关键词：Testing; Concurrency; Activity Sequence Graph;(ASG); synchronization fault; loop fault; scenario faults.