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  • 标题:A Critical Review :Side Channel Leakage Attacks on VLSI Cryptography
  • 本地全文:下载
  • 作者:Jyoti Sharma ; Najeeb-ud-din
  • 期刊名称:International Journal of Computer Science & Technology
  • 印刷版ISSN:2229-4333
  • 电子版ISSN:0976-8491
  • 出版年度:2011
  • 卷号:2
  • 期号:3(Version 2)
  • 出版社:Ayushmaan Technologies
  • 摘要:Side channel leakage attacks are the main concern for the electronic cryptographic chips like ASICs, FPGA’s, and Smart Cards etc. These electronic devices leaks information about the operations, they process. The information can be power consumed which leads to power analysis attacks, time taken which leads to timing analysis attacks, or in the form of Electromagnetic radiations which leads to electromagnetic attacks. There are specific methods for analyzing these leakages. There can be design methodology to restrict these attacks. Different types of implementation attacks require different countermeasures that vary significantly in strength and incurred overheads. These methods can be ad hoc countermeasures which make these attacks difficult to implement while on the other hand there are also methodologies of totally removing these attacks by suppressing the leakage parameters. The countermeasures which can totally remove the attacks are always preferred as compared to the ad hoc countermeasures.
  • 关键词:Cryptographic Hardware attacks; Power Analysis Attack; Side;Channel Leakages; Timing Analysis Attack; Electromagnetic;Attack.
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