文章基本信息

标题：Scanning Transmission Electron Microscopy at High Resolution
本地全文：下载
作者：J. Wall ; J. Langmore ; M. Isaacson 等
期刊名称：Proceedings of the National Academy of Sciences
印刷版ISSN：0027-8424
电子版ISSN：1091-6490
出版年度：1974
卷号：71
期号：1
页码：1-5
DOI：10.1073/pnas.71.1.1
语种：English
出版社：The National Academy of Sciences of the United States of America
摘要：We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 A is found in dark field images of micro-crystallites of uranium and thorium compounds. Furthermore, adequate contrast is available to observe single atoms as light as silver.
关键词：atom motion ; electron optics ; single atom visibility ; carbon films ; field emission source