期刊名称:Electronic Colloquium on Computational Complexity
印刷版ISSN:1433-8092
出版年度:2010
卷号:2010
出版社:Universität Trier, Lehrstuhl für Theoretische Computer-Forschung
摘要:In this work we consider linear codes which are locally testable
in a sublinear number of queries. We give the first general family
of locally testable codes of exponential size. Previous results of
this form were known only for codes of quasi-polynomial size (e.g.
Reed-Muller codes). We accomplish this by showing that any affine
invariant code over Fpn of size pp(n)
is locally testable using poly(logpn) queries.
Previous general result for affine invariant codes were known only
for sparse codes, i.e. codes of size pO(n). The main new
ingredients used in our proof are a new extension of the Weil bound for character
sums, and a Fourier-analytic approach for estimating the weight
distribution of affine invariant codes.
关键词:affine invariant codes, local testing, weil bound