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文章基本信息

  • 标题:Encouraging Students to Think Critically: Regression Modelling and Goodness-of-Fit
  • 本地全文:下载
  • 作者:Timothy E. O'Brien ; Gerald M. Funk
  • 期刊名称:Journal of Data Science
  • 印刷版ISSN:1680-743X
  • 电子版ISSN:1683-8602
  • 出版年度:2009
  • 卷号:7
  • 期号:02
  • 页码:235-253
  • 出版社:Tingmao Publish Company
  • 摘要:

    This note underscores important considerations that should be taken into account when teaching students to check for inadequacies of a given linear, nonlinear or logistic regression models. Key illustrations are provided which underscore the shortcomings of currently used procedures. A brief overview of nonlinear regression models is given in order to lay the foundation for testing for lack of fit in nonlinear models. This paper also introduces a new 'scaled' binary logistic regression model to highlight potential problems with the usual logistic model, and implications for choosing a robust optimal experimental design are also underscored and discussed.

  • 关键词:Goodness-Of-Fit;Logistic Regression Models;Regression Models;Nonlinear Models;Binary Logistic Regression;Logistic Model
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