文章基本信息

标题：Test Case Generation for Context Testing of Embedded Systems
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作者：Qi-Ping Yang, Tae-Hyong Kim
期刊名称：International Journal of Computer Science and Network Security
印刷版ISSN：1738-7906
出版年度：2007
卷号：7
期号：11
页码：142-148
出版社：International Journal of Computer Science and Network Security
摘要：The context of a modular system through which its embedded components interact with the user is the main development target of the modular system because developers usually purchase embedded components on the market. Therefore, context testing is necessary for the development of a reliable modular system. Test case generation for context testing may be complicated as the tester cannot directly control the interfaces between the context and the embedded components. This paper first shows a basic solution approach and its incompleteness. Then it investigates the conditions for avoiding nondeterminism in context testing. A graph conversion algorithm is also proposed which constructs safer context specifications for test generation of context testing without nondeterminism.
关键词：Embedded System, Context Testing, Test Case Generation