文章基本信息

标题：Concurrent Defects and Test Coverage Criteria
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作者：Bidush Kumar Sahoo ; Mitrabinda Ray
期刊名称：Journal of Software
印刷版ISSN：1796-217X
出版年度：2016
卷号：11
期号：10
页码：994-1007
DOI：10.17706/jsw.11.10.994-1007
出版社：Academy Publisher
摘要：The concurrent programs mostly specify two or more processes that work together in performing a job. Among them each process is a sequential program that implements series of statements. The processes usually work together by conversing using variables or message passing. So, testing a concurrent program is complex for its non determinism behavior. A number of methods such as locking, serialization, time stamp etc. are proposed to deal with non deterministic behavior. The paper deals with several coverage criteria for testing concurrent programs. Various coverage criteria such as interleaving, synchronization, ordered sequence, data flow, condition based etc are discussed with their capability in detecting bugs caused by synchronization. It discusses the expected bugs in the different criteria. Through discussion, it provides the way to cover all possible expected bugs.
其他关键词：Coverage criteria, interleaving, synchronization, data flow, condition coverage, serialization, timestamp.