文章基本信息

标题：Sparseness and Smoothness Regularized Imaging for improving the resolution of Cryo-EM single-particle reconstruction
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作者：Zhenwei Luo ; Adam A. Campos-Acevedo ; Longfei Lv 等
期刊名称：Proceedings of the National Academy of Sciences
印刷版ISSN：0027-8424
电子版ISSN：1091-6490
出版年度：2021
卷号：118
期号：2
页码：1
DOI：10.1073/pnas.2013756118
出版社：The National Academy of Sciences of the United States of America
摘要：In this paper, we present a refinement method for cryo-electron microscopy (cryo-EM) single-particle reconstruction, termed as OPUS-SSRI (Sparseness and Smoothness Regularized Imaging). In OPUS-SSRI, spatially varying sparseness and smoothness priors are incorporated to improve the regularity of electron density map, and a type of real space penalty function is designed. Moreover, we define the back-projection step as a local kernel regression and propose a first-order method to solve the resulting optimization problem. On the seven cryo-EM datasets that we tested, the average improvement in resolution by OPUS-SSRI over that from RELION 3.0, the commonly used image-processing software for single-particle cryo-EM, was 0.64 Å, with the largest improvement being 1.25 Å. We expect OPUS-SSRI to be an invaluable tool to the broad field of cryo-EM single-particle analysis. The implementation of OPUS-SSRI can be found at https://github.com/alncat/cryoem .
关键词：Cryo-EM ; 3D reconstruction ; ill-posed inverse problem ; smoothness ; sparseness