文章基本信息

标题：Experimental evaluation of the deadtime phenomenon for GM detector: deadtime dependence on operating voltages
本地全文：下载
作者：Bader Almutairi ; Syed Alam ; Tayfun Akyurek 等
期刊名称：Scientific Reports
电子版ISSN：2045-2322
出版年度：2020
卷号：10
期号：1
页码：1-15
DOI：10.1038/s41598-020-75310-3
出版社：Springer Nature
摘要：A detailed analysis of Geiger Mueller counter deadtime dependence on operating voltage is presented in the manuscript using four pairs of radiation sources. Based on two-source method, detector deadtime is calculated for a wide range of operating voltages which revealed a peculiar relationship between the operating voltage and the detector deadtime. In the low voltage range, a distinct drop in deadtime was observed where deadtime reached a value as low as a few microseconds (22 µs for 204Tl, 26 µs for 137Cs, 9 µs for 22Na). This sharp drop in the deadtime is possibly due to reduced recombination with increasing voltage. After the lowest point, the deadtime generally increased rapidly to reach a maximum (292 µs for 204Tl, 277 µs for 137Cs, 258 µs for 22Na). This rapid increase in the deadtime is mainly due to the on-set of charge multiplication. After the maximum deadtime values, there was an exponential decrease in the deadtime reaching an asymptotic low where the manufacturer recommended voltage for operation falls. This pattern of deadtime voltage dependence was repeated for all sources tested with the exception of 54Mn. Low count rates leading to a negative deadtime suggested poor statistical nature of the data collected for 54Mn and the data while being presented here is not used for any inference.
其他摘要：Abstract A detailed analysis of Geiger Mueller counter deadtime dependence on operating voltage is presented in the manuscript using four pairs of radiation sources. Based on two-source method, detector deadtime is calculated for a wide range of operating voltages which revealed a peculiar relationship between the operating voltage and the detector deadtime. In the low voltage range, a distinct drop in deadtime was observed where deadtime reached a value as low as a few microseconds (22 µs for 204 Tl, 26 µs for 137 Cs, 9 µs for 22 Na). This sharp drop in the deadtime is possibly due to reduced recombination with increasing voltage. After the lowest point, the deadtime generally increased rapidly to reach a maximum (292 µs for 204 Tl, 277 µs for 137 Cs, 258 µs for 22 Na). This rapid increase in the deadtime is mainly due to the on-set of charge multiplication. After the maximum deadtime values, there was an exponential decrease in the deadtime reaching an asymptotic low where the manufacturer recommended voltage for operation falls. This pattern of deadtime voltage dependence was repeated for all sources tested with the exception of 54 Mn. Low count rates leading to a negative deadtime suggested poor statistical nature of the data collected for 54 Mn and the data while being presented here is not used for any inference.