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标题：Assessment of fit of item response theory models used in large-scale educational survey assessments
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作者：Peter W. van Rijn ; Sandip Sinharay ; Shelby J. Haberman 等
期刊名称：Large-scale Assessments in Education
电子版ISSN：2196-0739
出版年度：2016
卷号：4
期号：1
页码：1-23
DOI：10.1186/s40536-016-0025-3
摘要：Abstract Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment of fit of item response theory models in the context of large-scale assessments, there is a scope of further research on the topic. We suggest two types of residuals to assess the fit of item response theory models in the context of large-scale assessments. The Type I error rates and power of the residuals are computed from simulated data. The residuals are computed using data from four NAEP assessments. Misfit was found for all data sets for both types of residuals, but the practical significance of the misfit was minimal.
关键词：Generalized residual; Item fit; Residual analysis; Two-parameter logistic model