期刊名称:Lecture Notes in Engineering and Computer Science
印刷版ISSN:2078-0958
电子版ISSN:2078-0966
出版年度:2019
卷号:2240
页码:397-401
出版社:Newswood and International Association of Engineers
摘要:High energy synchrotron X-ray diffraction is
widely used for residual stress evaluation. Rapid and accurate
conversion of 2D diffraction patterns to 1D intensity plots is an
essential step used to prepare the data for subsequent analysis,
particularly strain evaluation. The conventional multi-step
conversion process based on radial binning of diffraction
patterns (‘caking’) is somewhat time consuming. A new method
is proposed here that relies on the direct ‘polar transformation’
of 2D X-ray diffraction patterns. As an example of using this
approach, residual strain values in an Al alloy bar containing a
Friction Stir Weld (FSW) and subjected to in situ bending were
calculated by using both ‘polar transformation’ and ‘caking’.
The results by the new approach show good agreement with
‘caking’ microstrain evaluation. However, the ‘polar
transformation’ technique simplifies the analysis process by
skipping 2D to 1D conversion and opens new possibilities for
robust 2D diffraction data analysis for strain evaluation.