文章基本信息

标题：Collaborative Optimization of Testing and Mapping for Network on Chip
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作者：Zhang Ying ; Chen Xin ; Ge Fen 等
期刊名称：Lecture Notes in Engineering and Computer Science
印刷版ISSN：2078-0958
电子版ISSN：2078-0966
出版年度：2018
卷号：2235&2236
页码：278-281
出版社：Newswood and International Association of Engineers
摘要：How to efficiently map the specific application to NoC infrastructure is always an important topic for complex SoC chips. At the same time, there are many challenges for testing of NoC. This paper proposes a novel collaborative optimization scheme of IP cores testing and NoC mapping. Associated with the pre-designed test structure, IP cores are partitioned into parallel testing groups to minimize the testing time. We adapt the Multi-Objective Genetic Algorithm to collaboratively optimize testing time and NoC mapping performance. Besides the process time is relatively decreased, the balance of testing and mapping overheads can be adjusted for various applications. The results of simulations and experiments on testing platform with ITC'02 benchmark circuits showed the effectiveness and flexibility of the collaborative testing and mapping optimization for NoC.
关键词：NoC testing; NoC mapping; Multi-objective; Genetic Algorithm; testing schedule