摘要:We present a new adaptive sampling method for statistical quality control. In thismethod, called LSI (Laplace sampling intervals), we use the probability distributionfunction of the Laplace standard distribution to obtain the sampling instants,depending on a k parameter that allows control of sampling costs. Several algebraicexpressions concerning the statistical properties of the LSI method are presented.We compare the LSI method with fixed sampling intervals (FSI) and variable samplingintervals (VSI) methods using a Shewhart X-bar control chart and evaluate thesensitivity of these sampling methods when the lower sampling interval is truncated.The results obtained show that the new method is a viable alternative in variouscritical contexts and situations.