文章基本信息

标题：On-Line Test Based on SBST of LVDT Demodulation Circuit for Avionics Controller
本地全文：下载
作者：Zhang Ying ; Zhang Xiaokai ; Jin Zhengfei 等
期刊名称：Engineering Letters
印刷版ISSN：1816-093X
电子版ISSN：1816-0948
出版年度：2019
卷号：27
期号：1
页码：31-39
出版社：Newswood Ltd
摘要：In recent years, deep sub-micron technology has promoted the booming of the semiconductor industry, but it also makes it difficult to test the chips. The integration of chips is becoming much more complicated, and traditional online test methods are incapable of testing high-reliability systems efficiently. Against this background, we propose a novel test structure based on Software Based Self-Test (SBST) to assist in testing aviation system. This structure employs a low-overhead microprocessor to control the entire test flow, including testing of the processor itself and testing of the target circuits. In order to achieve ideal test effect, we focus on applying optimal test methods to different parts of the circuit such as DFT and ATPG. The on-line test results of a LVDT module for avionics control system proves that the test structure is efficient and flexible.
关键词：SBST; On-line Test; CPU Self-Test; ATPG