文章基本信息

标题：Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification
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作者：Nusrat Jahan ; Hanwei Wang ; Shensheng Zhao 等
期刊名称：Nanophotonics
印刷版ISSN：2192-8606
电子版ISSN：2192-8614
出版年度：2019
卷号：8
期号：10
页码：1659-1671
DOI：10.1515/nanoph-2019-0181
出版社：Walter de Gruyter GmbH
摘要：Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.
关键词：atomic force microscopy (AFM) ; chirality ; nanostructures ; optical forces ; polarization ; structured light