文章基本信息

标题：Influential and theoretical analysis of nano-defect in the stub resonator
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作者：Hui Xu ; Hongjian Li ; Boxun Li 等
期刊名称：Scientific Reports
电子版ISSN：2045-2322
出版年度：2016
卷号：6
期号：1
DOI：10.1038/srep30877
语种：English
出版社：Springer Nature
摘要：We investigate a classic optical effect based on plasmon induced transparency (PIT) in a metal-insulator-metal (MIM) bus waveguide coupled with a single defective cavity. With the coupled mode theory (CMT), a theoretical model, for the single defective cavity, is established to study spectral features in the plasmonic waveguide. We can achieve a required description for the phenomenon, and the theoretical results also agree well with the finite-difference time-domain (FDTD) method. Our researches show that the defect's position and size play important roles in the PIT phenomenon. By adjusting the position and size of the defect, we can realize the PIT phenomenon well and get the required slow light effect. The proposed model and findings may provide guidance for fundamental research of the control of light in highly integrated optical circuits.