文章基本信息

标题：TEST QUALITY ASSESSMENT BASED ON SMALL DELAY DEFECTS
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作者：Eduardas Bareiša ; Vacius Jusas ; Kęstutis Motiejūnas 等
期刊名称：European Integration Studies
印刷版ISSN：2335-8831
出版年度：2015
卷号：38
期号：4
DOI：10.5755/j01.itc.38.4.12076
语种：English
出版社：Kaunas University of Technology
摘要：The quality of delay testing focused on small delay defects is not known when transition fault model is used. The paper presents a method that evaluates the quality of the delay test according to the covered paths of the circuit and constructs the paths, which could be used as the input to the path delay test generator. All the constructed paths are testable. The complexity of the circuit has no direct impact on the path construction. The path construction is based on the information provided by TetraMAX transition fault simulator. The transition fault simulator forms a text file that contains the complete information on the propagation of the transitions along the lines of the circuit. The experimental results demonstrate the ability to assess the quality of the delay test according to the covered paths.