文章基本信息

标题：Difference in anisotropic etching characteristics of alkaline and copper based acid solutions for single-crystalline Si
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作者：Wei Chen ; Yaoping Liu ; Lixia Yang 等
期刊名称：Scientific Reports
电子版ISSN：2045-2322
出版年度：2018
卷号：8
期号：1
页码：3408
DOI：10.1038/s41598-018-21877-x
语种：English
出版社：Springer Nature
摘要：/Cu and different electronic properties of different Si planes, the etching of Si substrate shows orientation-dependent. Different from the upright pyramid obtained by alkaline solutions, the formation of inverted pyramid results from the coexistence of anisotropic etching and localized etching process. The obtained structure is bounded by Si {111} planes which have the lowest etching rate, no matter what orientation of Si substrate is. The Si etching rate and (100)/(111) etching ratio are quantitatively analyzed. The different behaviors of anisotropic etching of Si by alkaline and Cu based acid etchant have been systematically investigated.