期刊名称：IEEE Transactions on Emerging Topics in Computing
印刷版ISSN：2168-6750
出版年度：2018
卷号：6
期号：4
页码：511-523
DOI：10.1109/TETC.2016.2586195
出版社：IEEE Publishing
摘要：Reconfigurable systems gained great interest in a wide range of application fields, including aerospace, where electronic devices are exposed to a very harsh working environment. Commercial SRAM-based FPGA devices represent an extremely interesting hardware platform for this kind of systems since they combine low cost with the possibility to utilize state-of-the-art processing power as well as the flexibility of reconfigurable hardware. In this paper we present OLT(RE) $^2$ : an on-line on-demand approach to test permanent faults induced by radiation in reconfigurable systems used in space missions. The proposed approach relies on a test circuit and on custom place and route algorithms. OLT(RE) $^2$ exploits partial dynamic reconfigurability offered by today's SRAM-based FPGAs to place the test circuits at run-time. The goal of OLT(RE) $^2$ is to test unprogrammed areas of the FPGA before using them, thus preventing functional modules of the reconfigurable system to be placed on areas with faulty resources. Experimental results have shown that (i) it is possible to generate, place and route the test circuits needed to detect on average more than 99 percent of the physical wires and on average about 97 percent of the programmable interconnection points of an arbitrary large region of the FPGA in a reasonable time and that (ii) it is possible to download and run the whole test suite on the target device without interfering with the normal functioning of the system.
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