文章基本信息

标题：An Approach to Measure Transition Density of Binary Sequences for X-Filling based Test Pattern Generator in Scan based Design
其他标题：An Approach to Measure Transition Density of Binary Sequences for X-Filling based Test Pattern Generator in Scan based Design
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作者：Sabir Hussain ; V. Malleshwara Rao
期刊名称：International Journal of Electrical and Computer Engineering
电子版ISSN：2088-8708
出版年度：2018
卷号：8
期号：4
页码：2063-2071
DOI：10.11591/ijece.v8i4.pp2063-2071
语种：English
出版社：Institute of Advanced Engineering and Science (IAES)
摘要：Switching activity and Transition density computation is an essential stage for dynamic power estimation and testing time reduction. The study of switching activity, transition densities and weighted switching activities of pseudo random binary sequences generated by Linear Feedback shift registers and Feed Forward shift registers plays a crucial role in design approaches of Built-In Self Test, cryptosystems, secure scan designs and other applications. This paper proposed an approach to find transition densities, which plays an important role in choosing of test pattern generator We have analyze conventional and proposed designs using our approache, This work also describes the testing time of benchmark circuits. The outcome of this paper is presented in the form of algorithm, theorems with proofs and analyses table which strongly support the same. The proposed algorithm reduces switching activity and testing time up to 51.56% and 84.61% respectively.
其他摘要：Switching activity and Transition density computation is an essential stage for dynamic power estimation and testing time reduction. The study of switching activity, transition densities and weighted switching activities of pseudo random binary sequences generated by Linear Feedback shift registers and Feed Forward shift registers plays a crucial role in design approaches of Built-In Self Test, cryptosystems, secure scan designs and other applications. This paper proposed an approach to find transition densities, which plays an important role in choosing of test pattern generator We have analyze conventional and proposed designs using our approache, This work also describes the testing time of benchmark circuits. The outcome of this paper is presented in the form of algorithm, theorems with proofs and analyses table which strongly support the same. The proposed algorithm reduces switching activity and testing time up to 51.56% and 84.61% respectively.
关键词：Electronics and Computer Engineering;LFSR; Switching activity; Transition densities; Testing time; Scan based designs; Benchmark testing