文章基本信息

标题：Method for Building Health Index of Darlington Transistor Based on KPCA and Mahalanobis Distance
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作者：Qiang Liu ; Jinjun Cheng ; Yangbo Tan 等
期刊名称：IOP Conference Series: Earth and Environmental Science
印刷版ISSN：1755-1307
电子版ISSN：1755-1315
出版年度：2018
卷号：170
期号：4
页码：042135
DOI：10.1088/1755-1315/170/4/042135
语种：English
出版社：IOP Publishing
摘要：In order to obtain characteristic parameters which can describe the healthy status of Darlington transistor, a method for building Health Index (HI) based on KPCA and Mahalanobis distance was proposed. Through the failure mechanism analysis and Accelerated Degradation Testing (ADT) of Darlington transistor, the degradation data of collector current and saturation voltage were obtained. For the degradation data has obvious nonlinear features and some noise which are unfavorable for failure analysis, a data processing method was put forward by using wavelet packet decomposition and Kernel Component Analysis (KPCA). The interference signal was filtered and the main components were obtained. By using this method. Finally, the Mahalanobis distance was used to fuse these components into Health Index. And the Health Index could represent how the healthy status of Darlington transistor changes. Through multiple sets of data verification, the Health Index used Mahalanobis distance showed higher prediction accuracy than the Euclidean distance with the same fault predict algorithm.