期刊名称：IEEE Transactions on Emerging Topics in Computing
印刷版ISSN：2168-6750
出版年度：2018
卷号：6
期号：2
页码：170-171
DOI：10.1109/TETC.2018.2802788
出版社：IEEE Publishing
摘要：The ten papers in this special section address issues related to the design, reliability, security and testing of integrated systems in the nanoscale era. These papers cover a wide spectrum of techniques, including the issues of low-power design, the test, the reliability, the security and trust of circuits manufactured with emerging technologies.
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