文章基本信息

标题：A Deep Survey on Mutational Testing and Test Adequacy Check
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作者：J Santhosh ; Mini N
期刊名称：International Journal of Innovative Research in Computer and Communication Engineering
印刷版ISSN：2320-9798
电子版ISSN：2320-9801
出版年度：2017
卷号：5
期号：8
页码：14109
DOI：10.15680/IJIRCCE.2017.0508041
出版社：S&S Publications
摘要：The Mutation Testing is a fault based software testing technique that has been widely studied so far.This helps to generate the effective test cases and it provides a testing criterion. The mutation adequacy testing andscore can be used to test the effectiveness of the test cases. It is capable to detect the faults and mistakes in the programas well. For successive future direction, this is necessary to analyze and compare the earlier works on the mutationtesting and test adequacy criterion check. This paper provides the comprehensive analysis of mutation testingapproaches, tools, techniques and its results. These analyses give evidence that Mutation Testing techniques and toolsare reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasinginterest.
关键词：Software Testing; Mutation Testing; Test adequacy criterion