文章基本信息

标题：Development of Auto-Ranging DAS on 32 bit ARM Cortex Processor for X-Ray Detectors
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作者：Sayali Dilip Kedar ; Piyush Saxena ; V.K.Dubey 等
期刊名称：International Journal of Innovative Research in Computer and Communication Engineering
印刷版ISSN：2320-9798
电子版ISSN：2320-9801
出版年度：2017
卷号：5
期号：5
页码：10650
DOI：10.15680/IJIRCCE.2017.0505092
出版社：S&S Publications
摘要：X-ray detectors analogous to ion chambers are used widely with the beam lines at Indus 2 (SRSSynchrotronRadiation Source). Sensing process parameter is of vital importance for signal readout in radiationdetectors, exclusively in the ionization chamber which are widely used for the measurement of flux of the ionizingradiations in SRS beam lines. The system is developed to sense and measure the current from the ion chamber in therange 10pA-10uA and its data logging using all in one 32-bit microcontroller STM32F401RE. The uniqueness of thesystem is auto-ranging of the current in the range pico to micro. To handle the large dynamic range, two freewheelingchannels of amplifiers are interfaced which are controlled by microcontroller. The presented work aims to describe anadvanced auto-ranging data acquisition system for accurate measurement of the ultra low current and displaying thecurrent graphically using vb.net. This paper helps in obtaining the ion chamber current in digital as well as graphicalformat.
关键词：Auto-ranging DAS; Ionization chamber; STM32F401RE; Visual Basic.Net.