文章基本信息

标题：Requirement Defect Identification: An Early Stage Perspective
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作者：Sandeep Kumar Nayak ; Raees A. Khan ; Md. Rizwan Beg 等
期刊名称：International Journal of Computer Science Issues
印刷版ISSN：1694-0784
电子版ISSN：1694-0814
出版年度：2012
卷号：9
期号：5
出版社：IJCSI Press
摘要：Delivery of reliable software has become a primary concern for the successful software development organizations. Successful and reliable software can be delivering only when the requirement documentation is reliable. There is various threats point in the requirement phase that causes for requirement defects and so defect occurring in the further phases of Software Development process. A key aspect of delivering and improving the software reliability it is necessary to be confident that the requirement delivered to the further phases must be reliable. Reliability measurement is the best characteristic of assessing gathered requirement statistics and their respective compiled documentation. A reliable requirement can be produce only after removing or resolving all types of requirement defects. Here we describe an automated requirement defect identification approach through introducing Defect Data Dictionary which is directly accessible by Requirement Inspection Participant (RIP) and Requirement Inspection Method (RIM) for comparative requirement inspection. This paper provides an overview of the automated approach of how the requirement defect are being detected and resolved to achieve Reliable Requirement Specification (RRS) [8]. Here, the assessment of reliability with respect to requirement defect before and after mitigation through Requirement Defect Detection Framework is given. This may help out requirement analyst for producing the Reliable Requirement Specification.
关键词：Reliable Requirement Specification; Reliability Assessment; Requirement Defect Identification; Requirement Inspection Participant (RIP) and Requirement Inspection Method (RIM) Requirement Defect; Severity and priority; Decision Table (DT) Defect Mitigation etc.