文章基本信息

标题：Characteristics of Local Modulation Beam Propagating through Spatial Filter System
本地全文：下载
作者：Kewei You ; Yanli Zhang ; Xuejie Zhang 等
期刊名称：Advances in Condensed Matter Physics
印刷版ISSN：1687-8108
电子版ISSN：1687-8124
出版年度：2018
卷号：2018
DOI：10.1155/2018/2545923
出版社：Hindawi Publishing Corporation
摘要：As local defects may significantly harm beam quality and affect safe operation, a systematic analysis of the ability of a spatial filter to alleviate these adverse effects is required. Thus, the evolutional characteristics of a beam modulated by a local defect propagating through a spatial filter system at an image reply plane and a downstream plane are analyzed in detail. Modulation stripes appear at the image reply plane; these are caused by the pinhole cutoff effect. The modulation degree increases with increasing defect size. The maximum intensification factor can reach 3.2 under certain conditions. Thus, the defect size should be restricted to a reasonable size for safe operation with a specified pinhole size. Moreover, a maximal value appears at the downstream plane, and the intensity enhances with increasing defect size. To ensure beam quality, the maximum allowable defect size and angle of the spatial filter should meet special constraints. The maximum allowable defect size is calculated based on practical configuration parameters.