文章基本信息

标题：State Transition Based Test Model and Test Case Generation Technique for Embedded System: An Empirical Approach
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作者：So-Young Jeong ; Cheol-Jung Yoo ; Hye-Min Noh 等
期刊名称：International Journal of Software Engineering and Its Applications
印刷版ISSN：1738-9984
出版年度：2016
卷号：10
期号：11
页码：233-254
DOI：10.14257/ijseia.2016.10.11.20
出版社：SERSC
摘要：Studies on the testing techniques required during process of black box testing in embedded system have been increasing tremendously . This paper suggests test model and test cas e generation method for model based testing of embedded system. Considering the complicated internal architecture and real - time characteristics of embedded system, test cases are generated by using the state based behavior modeling method. The proposed sta te transition model based test case generation method suggests systematic procedures ranged from the use case specification to the test case generation. Entire procedure of test case generation in MP3 player case which uses the suggested method is presente d in this paper. With the created test cases, the interaction among the components of embedded system can be easily figured out, thereby helping easy error detection. Moreover, the test cases applied with characteristics and constraints of embedded system could be achieved by modeling system behavior using SysML
关键词：Embedded System; State Modeling; State Transition Diagram; Test Case ; Generation; SysML