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  • 标题:Security Analysis of Tunnel Field-Effect Transistor for Low Power Hardware
  • 本地全文:下载
  • 作者:Shayan Taheri ; Jiann-Shiun Yuan
  • 期刊名称:International Journal of Computer Science and Information Technologies
  • 电子版ISSN:0975-9646
  • 出版年度:2017
  • 卷号:8
  • 期号:2
  • 页码:271-275
  • 出版社:TechScience Publications
  • 摘要:Security and energy are considered as the mostimportant parameters for designing and building a computingsystem nowadays. Today’s attacks target different layers ofthe computing system (i.e. software and hardware).Introduction of new transistor technologies to the integratedcircuits design is beneficial, especially for low energyrequirements. The new devices have unique features andproperties that provide security advantages. However, theseproperties may come to the aid of an adversary to designstronger attacks. Therefore, the advantages as well as thedisadvantages of these technologies need to be well studied.This paper demonstrates the area and power efficiency of thetunnel field-effect transistor (TFET) technology along withanalyzing its security aspects.
  • 关键词:Hardware Security; Tunnel Field Effect;Transistor; Advanced Encryption Standard; and FabScalar
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