文章基本信息

标题：Smart Test Case Quantifier Using MC/DC Coverage Criterion
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作者：S. Shanmuga Priya ; Sheba Kezia Malarchelvi
期刊名称：International Journal of Advanced Computer Research
印刷版ISSN：2249-7277
电子版ISSN：2277-7970
出版年度：2014
卷号：4
期号：14
页码：396-401
出版社：Association of Computer Communication Education for National Triumph (ACCENT)
摘要：Software testing, an important phase in Software Development Life Cycle (SDLC) is a time consuming process. Information shows that nearly 40 to 50% of software development time is spent in testing. Manual testing is labour-intensive and error-prone so there is a need for automatic testing technique. Automation brings down the time and cost involved in testing. When testing software, there are often a massive amount of possible test-cases even for quite simple systems. Running each and every feasible test-case is certainly not a choice, so designing test-cases becomes a significant part of the testing process. NASA proposed Modified Condition/Decision Coverage (MC/DC) testing criterion in 1994, which is a white box testing criterion. The objective of this paper is to automate the generation of minimum number of test cases required to test a system with maximum coverage by removing the redundant test cases using MC/DC criterion. The work also gives a tool Smart Test Case Generator Tool (STCGT) that automates the minimum number of test cases required to test the source code. This will give an idea about the test cases execution for the beginners of the testing team, thereby, aids in a quality on-time product.
关键词：Test Case; MC/DC; White Box Testing; Automation.