文章基本信息

标题：Test-Case Generation for Embedded Binary Code Using Abstract Interpretation
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作者：Thomas Reinbacher ; J{\"o}rg Brauer ; Martin Horauer 等
期刊名称：OASIcs : OpenAccess Series in Informatics
电子版ISSN：2190-6807
出版年度：2011
卷号：16
页码：101-108
DOI：10.4230/OASIcs.MEMICS.2010.101
出版社：Schloss Dagstuhl -- Leibniz-Zentrum fuer Informatik
摘要：This paper describes a framework for test-case generation for microcontroller binary programs using abstract interpretation techniques. The key idea of our approach is to derive program invariants a priori, and then use backward analysis to obtain test vectors that are executed on the target microcontroller. Due to the structure of binary code, the abstract interpretation framework is based on propositional encodings of the program semantics and SAT solving.
关键词：Test-Case Generation; Embedded Binary Code; Abstract Interpretation