文章基本信息

标题：Performance Analysis of Digital Circuits Device under Test at Different FPGA Families
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作者：T.S Muralirajan ; P.SaravanaKumar ; S.Parvathi 等
期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2015
期号：MULTICON
页码：438
出版社：S&S Publications
摘要：Despite their tremendous success over the years, the Digital circuits are still confronted with some of thecritical challenges such as, manufacture, maintenance, and repair. To fulfill this, digital integrated circuits industrydefined an Integrated Automatic test generation (ATG) / Automatic Test Equipment System for complex boards /circuits, which comprises Low Cost, Reconfigurable and easy to use digital circuits. It allows circuit parameters to beextracted from HDL Simulation then functionality is verified by using Xilinx Environment. The aim is to develop anATG technique called Behavior - Based Automatic Test Generation technique (BBATG), where the system uses thestructural model to describe circuit board as an interconnection of devices. Thus application of a deterministicalgorithm to deduce the tests for complex circuit boards. Unlike most other deterministic ATG using the stuck-atfaultmodel, BBATG use the device behavior fault model which can completely describe functions and pin timing relationsfor a combination or sequence device, and then needn‟t decompose devices to gate-level descriptions. The objective ofthe functional testing is to validate the correct operation of the system with respect to its functional specifications.Functional Testing is carried out for a small number of vector combinations. The main focus is based on easy-to-useand reconfigurable automatic test machine referred as FATE (FPGA-based ATE). So the test generation for digitalcircuits with VLSI can be further simplified and optimized. The designed FATE is verified with and without fault usingXilinx software and result are included.
关键词：ATG; BBATG; Xilinx software; FATE.