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标题：Recursive Pseudo-Exhaustive Two-Pattern Generator
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作者：PRIYANSHU PANDEY ; VINOD KAPSE
期刊名称：International Journal of Advanced Research in Computer Engineering & Technology (IJARCET)
印刷版ISSN：2278-1323
出版年度：2012
卷号：1
期号：5
页码：380-385
出版社：Shri Pannalal Research Institute of Technolgy
摘要：Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation. In (n, k)-adjacent bit pseudo-exhaustive test sets, all 2k binary combinations appear to all adjacent k-bit groups of inputs. With recursive pseudoexhaustive generation, all (n, k)-adjacent bit pseudoexhaustive tests are generated for k, n and more than one modules can be pseudo-exhaustively tested in parallel. In order to detect sequential (e.g., stuck-open) faults that occur into current CMOS circuits, two-pattern tests are exercised. Also, delay testing, commonly used to assure correct circuit operation at clock speed requires two-pattern tests. In this paper a pseudoexhaustive two-pattern generator is presented, that recursively genera tes all two-pattern (n, k)- adjacent bit pseudoexhaustive tests for all k, n. To the best of our knowledge, this is the first time in the open literature that the subject of recursive pseudoexhaustive two -pattern testing is being dealt with. A software-based implementation with no hardware overhead is also presented.
关键词：BIT (built-in-test); generic pseudoexhaustive ; test & recursive pseudoexhaustive test; two pattern ; generation.