文章基本信息

标题：Design and Development of JTAG for Trace and Debug of Controller and Implementation on FPGA
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作者：Manjunath T.N ; Sunil T.D ; M. Z Kurian 等
期刊名称：International Journal of Advanced Research in Computer Engineering & Technology (IJARCET)
印刷版ISSN：2278-1323
出版年度：2014
卷号：3
期号：4
页码：1127-1130
出版社：Shri Pannalal Research Institute of Technolgy
摘要：The paper aims about the trace and debug of any N-bit controller using a JTAG, here controller core is traced using a interfacing device known as JTAG (Joint Test Action Group). JTAG is an advanced DFT Technique for the purpose of testing an ASIC, as such there are various technique for this purpose, but JTAG is chosen for its unique feature of in built state machine which can used for the purpose of both interfacing and display unit with a device as well as a testing device.
关键词：JTAG ;DFT; Testing