文章基本信息

标题：Some Characteristics of the Analytical Plotter System JX
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作者：Liu. X ; Sun. L ; Liu. S 等
期刊名称：ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences
印刷版ISSN：2194-9042
电子版ISSN：2194-9050
出版年度：1988
卷号：XXVII Part B2
页码：263-274
出版社：Copernicus Publications
摘要：The paper dlscrlbes some new concepts, new methods of theAnalytical Plotter System JX (made in China), incLuding thesystem structure, the deveLopment to smaLL system, discardingoperational redundancy, menu formation, user's interface, reduceddigital map data, microcomputer-aided servo Logic, generaLoutLine drawing tn media of semi-conductor memory (keep track ofcolLecting process),preliminary intelligence and etc.8y convenient with the cheaper,of higher capacity, more fastmicrocomputer, no~ the deslgners could stand at a more advancedstage than theprivious ones. In order to avoid non-obsolescence ofhardvares in the rapid developing process of microelectronics, andmodefication of softwares, the system should be consistent with thedevelopment of certain series of CPU unit.A new kind of AnalyticaLPLotter has been des19ned successfulLy by Research Institute ofSurveying & Mapping and Wuxi Instrument Factory of Surveying &Mappin9 through 4 years efforts(See f19 1).The Characteristics ofthe instrument are as foLLows.