文章基本信息

标题：Electrothermal Analysis for Super-Junction TMOSFET with Temperature Sensor
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作者：Lho, Young Hwan ; Yang, Yil-Suk
期刊名称：ETRI Journal
印刷版ISSN：1225-6463
电子版ISSN：2233-7326
出版年度：2015
卷号：37
期号：5
页码：951-960
DOI：10.4218/etrij.15.0115.0226
语种：English
出版社：Electronics and Telecommunications Research Institute
摘要：For a conventional power metal-oxide-semiconductor field-effect transistor (MOSFET), there is a trade-off between specific on-state resistance and breakdown voltage. To overcome this trade-off, a super-junction trench MOSFET (TMOSFET) structure is suggested; within this structure, the ability to sense the temperature distribution of the TMOSFET is very important since heat is generated in the junction area, thus affecting its reliability. Generally, there are two types of temperature-sensing structures-diode and resistive. In this paper, a diode-type temperature-sensing structure for a TMOSFET is designed for a brushless direct current motor with on-resistance of . The temperature distribution for an ultra-low on-resistance power MOSFET has been analyzed for various bonding schemes. The multi-bonding and stripe bonding cases show a maximum temperature that is lower than that for the single-bonding case. It is shown that the metal resistance at the source area is non-negligible and should therefore be considered depending on the application for current driving capability.
关键词：TMOSFET;super-junction TMOSFET;trench MOSFET;embedded temperature sensor;bipolar sensor structure